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Specular reflection of x rays in the anomalous dispersion region of the silicon K absorption edge

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Abstract

The spectral distribution of continuous x radiation, specularly reflected on a silicon mirror, is determined for various glancing angles near the K absorption edge. Anomalies of reflectivity are revealed, along with fine structure, in the photoabsorption spectrum beyond the edge. They are interpreted by the anomalous behavior of the refractive index in this region. An experimental dispersion curve for the real part of the refractive index is deduced.

© 1980 Optical Society of America

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