Abstract

A polarization-insensitive multimode antisymmetric waveguide Bragg grating (MASWBG) filter based on an SiN–Si dual-layer stack is demonstrated. Carefully optimized grating corrugations patterned on the sidewall of a silicon waveguide and SiN overlay are used to perturbate TE and TM modes, respectively. Furthermore, the lateral-shift apodization technique is utilized to improve the sidelobe suppression ratio (SLSR). A good overlap between the passbands measured in TE and TM polarization states is obtained. Insertion losses, SLSRs, and 3-dB bandwidths of measured passbands in TE/TM polarizations are 1/1.72 dB, 18.5/19.1 dB, and 5.1/3.5 nm, respectively.

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