You have attempted to access the full-text of an Early Posting article. Access is available via an institutional subscription.
See the Early Posting FAQ page for additional information.
See the Early Posting FAQ page for additional information.
Method to overlay an interference field over a grating using only the grating’s profile symmetry
Optics Letters- received 01/18/2024; accepted 04/18/2024; posted 04/22/2024; Doc. ID 519122
- Abstract: We theoretically present and experimentally validate a method to overlay the interference field (for making straight-line holographic gratings) with a real grating and a derived method to measure the lateral shift between two real gratings. The methods rely only on the real gratings’ profile symmetry and they are robust against variations of the real gratings’ profile parameters.