About This Cover
20 December 2017, Volume 4, Issue 12, pp. 1451-1559
Tilted cross-section SEM image of three 80-nm-trench nano-ridges. See Shi et al., pp. 1468-1473. See print version of the cover.
Tilted cross-section SEM image of three 80-nm-trench nano-ridges. See Shi et al., pp. 1468-1473. See print version of the cover.