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Influences of misalignment errors of optical components in an orthogonal two-axis Lloyd's mirror interferometer

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Abstract

This paper presents a detailed analysis on the influence of misalignment errors of optical components in an orthogonal two-axis Lloyd’s mirror interferometer, which can fabricate two-dimensional grating structures in a single exposure. In an ideal condition, defect-free two-dimensional grating structures can be fabricated by the interferometer. However, in a real case, visible stripes caused by misalignment errors of the optical components in the interferometer always appear on the fabricated grating structures. In this paper, theoretical analysis and experiments are carried out to analyze the influences of the misalignment errors of the optical components in the orthogonal two-axis Lloyd's mirror interferometer.

© 2016 Optical Society of America

1. Introduction

A diffraction grating is one of the key components [1] in modern optical measuring instruments such as optical encoders [2]. In an encoder system, a laser beam is made incident to a scale grating so that displacement of a measurement target, a side surface of which the scale is attached in most of the cases, can be detected by monitoring interference signals generated by superimposing diffracted light rays from the scale [2]. Measurement will be carried out by using the grating structures as scale graduations. With the employment of a signal interpolation technique, a measurement resolution of the state-of-the-art linear encoder system can reach to several-ten pm, while the measurement range, which is determined by the length of grating, can reach to several-ten meters [3]. Meanwhile, multi-axis encoders employing two-dimensional (2D) grating structures as a scale have also been developed for simultaneous measurement of the multi degree-of-freedom displacement [4–6]. In order to realize a high measurement resolution and accuracy of the multi-axis encoders, the 2D gratings to be used as their scales are required to have following features. Firstly, it is necessary to fabricate 2D grating structures having uniform grating periods. Secondly, diffraction efficiencies of both the negative and positive diffraction beams need to be consistent for higher signal to noise ratios of the interference signals. Finally, the grating period is preferred to be as short as possible to achieve further higher measurement resolution.

Among several fabrication process for the grating structures [7–11], laser interference lithography (LIL) is a promising method for fabrication of the 2D grating structures [11]. In LIL, a laser beam is split into two beams by division of amplitude or division of wavefront method. The two coherent beams will be superimposed and will generate interference fringes, which can be utilized for a pattern exposure. Although many optical configurations have been developed so far, the Lloyd's mirror interferometer is a good candidate for fabrication of the grating structures due to its simple optical configuration [11]. The conventional one-axis Lloyd's mirror interferometer, which has a mirror aligned perpendicularly with respect to a substrate, can fabricate one-dimensional grating structures. In addition, it can fabricate 2D grating structures with second exposure process after rotating the grating substrate 90° [12]. However, the grating structures generated in the first exposure will be influenced by the background light in the second exposure, and the depths of the grating structures will be different in the X- and Y- directions. As a result, diffraction efficiencies of both the negative and positive diffraction beams will not be consistent; this is a fatal problem for the encoder system since it directly affects the signal-to-noise ratio of the interference signals.

In order to solve the problem caused by the two-step exposure, several optical configurations, which can generate 2D grating structures at a single exposure, have been developed [13–16]. Among them, an orthogonal two-axis Lloyd's interferometer [16] can fabricate orthogonal 2D grating structures having a symmetric profile, which is required for consistent diffraction efficiencies in both the positive and negative directions. However, we have found that visible stripes, which affect the uniformity of the diffraction efficiency of the fabricated grating, always appear on the fabricated grating structures. Although modulation of the interference patterns as a consequence of the misalignment of the angle between two interferometer mirrors is predicted in computer simulation [16], a detailed mechanism of how the visible stripes appear on the fabricated grating structures has not been clear to the best of the knowledge of the authors.

In responding to the background described above, in this paper, theoretical analysis and experiments are carried out to investigate the mechanism of how the visible stripes appear on the grating structures. Influences of the misalignment errors of optical components in the orthogonal two-axis interferometer are theoretically investigated. Computer simulation is also carried out to simulate the visible stripes to be generated under the influences of misalignment errors of the optical components. Furthermore, a modified optical configuration for the orthogonal two-axis Lloyd's mirror interferometer is proposed, and its feasibility is verified in experiments.

2. Principle of the orthogonal two-axis Lloyd's mirror interferometer

An optical configuration for the orthogonal two-axis Lloyd's mirror interferometer is based on the traditional one-axis Lloyd’s mirror interferometer [11], which can generate one-dimensional grating structures. Figures 1(a) and 1(b) show schematics of the traditional one-axis Lloyd's mirror interferometer and the orthogonal two-axis Lloyd's mirror interferometer, respectively. In the optical configuration for the orthogonal two-axis Lloyd's mirror interferometer, another mirror referred to as the Y-mirror in this paper is added to that for the traditional one-axis Lloyd’s mirror interferometer in such a way that the normal of Y-mirror is perpendicular to both the normals of the substrate and the X-mirror. By using these two mirrors, a collimated laser light made incident to the interferometer can be divided into four beams; the beam directly projected onto the substrate (beam 1); the beam projected onto the substrate after being reflected by the X-mirror (beam 2); the beam projected onto the substrate after being reflected by the Y-mirror (beam 3); the beams projected onto the substrate after being reflected by both the X- and Y-mirrors (beam 4 and 4'). The 2D fringe patterns generated by the interference among the four beams can be calculated by superimposing electric fields of the beams. An electric field of a laser beam can be expressed as follows [17]:

Ei=Eieiexp(jkir+γi)(i=1,2,3,4)
where r is the position vector, Ei is the real electric field amplitude, ei is a unit vector in the polarization direction of the laser beam, γi is the initial phase, and kiis the wave vector. Denoting the angle between the direction of incident beam and the substrate surface as θi, and the azimuthal angle of the laser light with respect to the X-axis as φ as shown in Fig. 1(c), the wave vector of each beam in the orthogonal two-axis Lloyd's mirror interferometer can be expressed as follows [16]:
k1=2πλ(cosθ1cosϕcosθ1sinϕsinθ1),k2=2πλ(cosθ2cosϕcosθ2sinϕsinθ2),k3=2πλ(cosθ3cosϕcosθ3sinϕsinθ3),k4=2πλ(cosθ4cosϕcosθ4sinϕsinθ4)
where λ is a wavelength of the laser light. The intensity distribution of the interference fringe I(r) can therefore be calculated as follows:
I(r)==14E2+2m=24n<mEmEnemencos{(knkm)r+φnφm}
According to Eq. (3), the periods of the interference fringes gnm to be generated by the interference between the two of those beams can be expressed as follows:
gnm=2π|kmkn|(n<m4)
As a consequence of the superimposition of the interference fringes, the 2D fringe patterns can be generated simultaneously. Assume φ = 45° and the mirrors and substrate are orthogonal with each other, which means θ1 = θ2 = θ3 = θ4, the X- and Y-directional fringe periods gx and gy, respectively, can be expressed as follows:

 figure: Fig. 1

Fig. 1 Optical configurations for the Lloyd's mirror interferometer: (a) Traditional one-axis Lloyd's mirror interferometer; (b) Orthogonal two-axis Lloyd's mirror interferometer; (c) Definition of θ and φ in this paper.

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gx=gy=λ2cosθ1

However, in a practical optical configuration for the orthogonal two-axis Lloyd's mirror interferometer, it is difficult to align the mirrors with respect to the substrate without angular misalignment errors. As a result, unexpected defects can be generated on the substrates. Figure 2 shows an example of such defects found on the 2D grating structures after the development process. As can be seen in the figure, visible stripes have appeared on the fabricated grating structures. Those visible stripes degrade the performance of the diffraction grating, and are therefore required to be eliminated. However, on the other hand, a root cause of the appearance of such visible stripes has not been clarified so far, which is one of the main motivations of the analysis described in the following of this paper.

 figure: Fig. 2

Fig. 2 Visible stripes observed on the fabricated grating structures: (a) A photograph of the fabricated grating structures; (b) Optical microscope image at the point A in (a) (bright area); (c) Optical microscope image at the point B in (a) (dark area).

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3. Influence of the misalignment errors of the optical setup

3.1 An overview of the theoretical analysis

To clarify the mechanism of the generation of visible stripes on the grating structures, theoretical analysis has been carried out based on a simple optical model of the orthogonal two-axis Lloyd's mirror interferometer shown in Fig. 1(b). The beam directly projected onto the substrate (beam 1) is assumed to be made incident to the substrate with the angle of θ between its propagating direction and the substrate surface. The substrate having its normal parallel with the Z-axis is placed edge to edge with the X- and Y-mirrors. Under the ideal condition without misalignment errors of the optical components in the setup, the azimuthal angle φ of the beam 1 with respect to the X-axis is 45°, while the angles between the X-mirror and the XY-plane ϕXY, the X-mirror and the XZ-plane ϕXZ, the Y-mirror and the XY-plane ϕYX, the Y-mirror and the YZ-plane ϕYZ are 90°. The normals of both the X- and Y-mirrors are parallel with the X- and Y-axes, respectively. Interference can occur in-between the two of those incident beams, and will generate equally spaced line interference fringes having a period gnm calculated by Eq. (4). The fringes are aligned along the direction perpendicular to the vector of (kmkn). Table 1 summarizes the line interference fringes to be generated by the interference between the two of those beams. As can be seen in the table, same line interference fringes can be generated by several combinations of the beams.

Tables Icon

Table 1. Interference fringe patterns and periods gnm to be generated by each pair of beams.

In the optical setup, there are two types of major misalignment; angular misalignment errors of the mirrors, and a deviation of the direction of the laser light made incident to the interferometer. A detailed analysis on the influences of each type of major misalignment is addressed in the following subsections.

3.2 Angular misalignment errors of the mirrors

As the first step of the analysis, the angular misalignment errors of the mirrors are included in the optical model. The angular misalignment errors of the X-mirror about the Y- and Z-axes are defined as ΔϕXY and ΔϕXZ, respectively, while those of the Y-mirror about the X- and Z-axes are defined as ΔϕYX and ΔϕYZ, respectively, as shown in Fig. 3. With the angular misalignment errors of the mirrors, the wave vector of each incident beam in Eq. (2) can be modified as follows:

 figure: Fig. 3

Fig. 3 Angular misalignment errors of the X- and Y-mirrors.

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k1=2πλ(cosθcosϕcosθsinϕsinθ),k2=2πλ(cos(θ+2ΔφXY)cos(ϕ2ΔφXZ)cos(θ+2ΔφXY)sin(ϕ2ΔφXZ)sin(θ+2ΔφXY)),k3=2πλ(cos(θ+2ΔφYX)cos(ϕ+2ΔφYZ)cos(θ+2ΔφYX)sin(ϕ+2ΔφYZ)sin(θ+2ΔφYX)),k4=2πλ(cos(θ+2ΔφXY+2ΔφYX)cos(ϕ2ΔφXZ2ΔφYZ)cos(θ+2ΔφXY+2ΔϕYX)sin(ϕ2ΔφXZ2ΔφYZ)sin(θ+2ΔφXY+2ΔφYX)),k4'=2πλ(cos(θ+2ΔφXY+2ΔφYX)cos(ϕ+2ΔφXZ+2ΔφYZ)cos(θ+2ΔφXY+2ΔφYX)sin(ϕ+2ΔφXZ+2ΔφYZ)sin(θ+2ΔφXY+2ΔφYX))

It should be noted that the deviation of the direction of the laser light is not included in the equations. Based on the wave vectors shown above, periods of line interference fringes between every two beams gnm can be calculated from Eq. (4). It should be noted that gnm to be calculated from Eq. (4) is on a symmetry plane of incidence, which has a normal parallel with the bisector of the angle between the two incident beams, as shown in Fig. 4. The period g'nm on the substrate is therefore different from gnm, and is required to be compensated by taking the difference between the symmetry plane of incidence and the substrate surface into consideration. Compensated periods of the line interference fringes on the substrate surface generated by every two beams and their compensation terms Anm are summarized in Table 2.

 figure: Fig. 4

Fig. 4 A geometric relationship between the symmetry plane of incidence and the substrate surface.

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Tables Icon

Table 2. Influences of the angular misalignment errors of the mirrors on the interference fringes and their periods.

As an example, now we consider the line interference fringes to be generated with the combination of beams 1 and 2 (Case 1), and those of the beams 3 and 4 (Case 2). According to Table 1, Y-directional line interference fringes with the same period (g12 = g34), a schematic of which is shown in Fig. 5(a), will be generated in both the cases with the optical setup free from any misalignment errors. Meanwhile, on the other hand, the line interference fringes to be generated by the two cases will be affected by the angular misalignment errors of the mirrors. Figure 5(b) shows a schematic of the line interference fringes to be generated in both the cases under the influences of the angular misalignment errors of the mirrors about the Z-axis (ΔϕXZ and ΔϕYZ). As can be seen in Table 2, periods of the line interference fringes will be different in both the cases (g'12g'34). In addition, the directions of the line interference fringes will also be different; the direction of the line interference fringes will be that of the bisector of an angle between the two incident beams projected on the XY plane. Therefore, the direction of the line interference fringes to be generated in Case 1 will have the angle of ΔϕXZ with respect to the original line interference fringes shown in Fig. 5(a). In the same manner, the direction of the line interference fringes to be generated in Case 2 will have the angle of (ΔϕXZ + 2ΔϕYZ). As a result of the superimposition of these line interference fringes, beat patterns and moiré fringe patterns caused by the different interference pattern periods and the deviations of the direction of line interference fringes could be generated as shown in Fig. 5(b).

 figure: Fig. 5

Fig. 5 Influences of the angular misalignment errors ΔϕXZ, and ΔϕYZ on the Y-directional line interference fringes: (a) Superimposed fringe patterns under the misalignment-free condition; (b) Superimposed fringe patterns with the angular misalignment errors of the mirrors ΔϕXZ and ΔϕYZ.

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3.3 Deviations of the direction of laser light

As a next step of the analysis, the deviation of the direction of laser light made incident to the two-axis Lloyd’s mirror interferometer is included in the optical model. By taking the deviations of the azimuthal angle Δφ and the angle between the direction of incident light and the substrate surface Δθ into consideration, the wave vector of each incident beam in Eq. (6) can be further modified as follows:

k1=2πλ(cos(θ+Δθ)cos(ϕ+Δϕ)cos(θ+Δθ)sin(ϕ+Δϕ)sin(θ+Δθ)),k2=2πλ(cos(θ+Δθ+2ΔφXY)cos(ϕ+Δϕ2ΔφXZ)cos(θ+Δθ+2ΔφXY)sin(ϕ+Δϕ2ΔφXZ)sin(θ+Δθ+2ΔφXY)),k3=2πλ(cos(θ+Δθ+2φYX)cos(ϕ+Δϕ+2ΔφYZ)cos(θ+Δθ+2ΔφYX)sin(ϕ+Δϕ+2ΔφYZ)sin(θ+Δθ+2ΔφYX)),k4=2πλ(cos(θ+Δθ+2ΔφXY+2ΔφYX)cos(ϕ+Δϕ2ΔφXZ2ΔφYZ)cos(θ+Δθ+2ΔφXY+2ΔφYX)sin(ϕ+Δϕ2ΔφXZ2ΔφYZ)sin(θ+Δθ+2ΔφXY+2ΔφYX)),k4'=2πλ(cos(θ+Δθ+2ΔφXY+2φYX)cos(ϕ+Δϕ+2ΔφXZ+2ΔφYZ)cos(θ+Δθ+2ΔφXY+2φYX)sin(ϕ+Δϕ+2ΔφXZ+2ΔφYZ)sin(θ+Δθ+2ΔφXY+2ΔφYX))
Based on the wave vectors shown above, periods of line interference fringes between every two beams are calculated and summarized in the same manner as the previous subsection, while the modified compensation terms Anm summarized in Table 3 are also included. It should be noted that the deviation of the angle between the direction of incident light and the substrate surface Δθ equally affects each case of the interference fringes, and is not the cause of the visible stripes. Meanwhile, as can be seen in Table 3, the deviation of azimuthal angle Δφ affects some cases, and could be the cause of the visible stripes.

Tables Icon

Table 3. Influences of the deviation of the direction of the laser light made incident to the interferometer

4. Computer simulation and experiments

4.1 Influences of the misalignment errors

Computer simulation and experiments were carried out to verify the feasibility of the theoretical analysis described in the previous section. Computer simulation was at first carried out to calculate the intensity distribution of the interference fringes to be generated as a consequence of the superimposition of several types of line interference fringes. Based on the optical model and the equations described in the previous section, light intensity at each position on the substrate surface was calculated. Parameters applied for the simulation is summarized in Table 4. The light wavelength λ was set to be 441.6 nm, which was consistent with that of the light source (HeCd laser) employed in the experiments described in the following of this paper. The angle between the direction of incident light and the substrate surface θ was set to be 71.805°, which was calculated from Eq. (5), so that the periods of the interference fringes gx and gy in the X- and Y-directions, respectively, would be 1 μm.

Tables Icon

Table 4. Parameters for the computer simulation.

At first, the influences of the angular misalignment errors of the mirrors were simulated. Figure 6 shows the intensity distributions of the interference fringes on the substrate surface with the angular misalignment error of the Y-mirror about the X-axis (ΔϕYX). In the simulation, ΔϕYX was changed from −0.08° to 0.08°, while all the other misalignment errors were set to be zero. As can be seen in the figure, visible stripes along the Y-direction having a constant period in the X-direction were found on the calculated intensity distributions except the case of ΔϕYX = 0°. In addition, the period of the visible stripes decreased with the increase of |ΔϕYX|. In the same manner, the influence of the angular misalignment error of the Y-mirror about the Z-axis (ΔϕYZ) was also simulated. ΔϕYZ was changed from −0.4° to 0.4°, while all the other misalignment errors were set to be zero. As can be seen in Fig. 7, several groups of visible stripes having different directions and periods exist on the substrate surface, resulting in complicated light intensity distributions. The behavior of these visible stripes well agrees with that predicted by the theoretical analysis in the previous section of this paper. Figure 8 shows an example of the interference fringes simulated under the condition of the optical setup having four angular misalignment errors of the mirrors (ΔϕXY, ΔϕXZ, ΔϕYX and ΔϕYZ). Several groups of visible stripes having different periods and directions can be found in the simulated intensity distribution.

 figure: Fig. 6

Fig. 6 Influence of the angular misalignment error of the Y-mirror about the X-axis (ΔϕYX): (a) A schematic of ΔϕYX; (b) ΔϕYX = −0.08°; (c) ΔϕYX = −0.04°; (d) ΔϕYX = 0°; (e) ΔϕYX = 0.04°; (f) ΔϕYX = 0.08°.

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 figure: Fig. 7

Fig. 7 Influence of the angular misalignment error of the Y-mirror about the Z-axis (ΔϕYZ): (a) A schematic of ΔϕYZ; (b) ΔϕYZ = −0.4°; (c) ΔϕYZ = −0.04°; (d) ΔϕYZ = 0°; (e) ΔϕYZ = 0.04°; (f) ΔϕYZ = 0.4°.

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 figure: Fig. 8

Fig. 8 Interference fringes affected by the angular misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δφ = 0°).

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The influence of the deviation of the direction of laser light was also simulated. Intensity distributions of the interference fringes with the deviation of the angle between the direction of incident light and the substrate surface Δθ shown in Fig. 9(a) was simulated. Figure 9(b) shows the intensity distributions of the interference fringes under the condition without any misalignment errors except Δθ. As can be seen in the figure, it is clear that Δθ does not cause the visible stripes. Computer simulation was also carried out under the same condition as the simulation shown in Fig. 8, in which four angular misalignment errors of the mirrors were included. Figure 9(c) shows the results. As can be seen in the figure, it was verified that the periods of the visible stripes were changed as the change of Δθ, which was due to the changes of fringe periods gx and gy.

 figure: Fig. 9

Fig. 9 Simulated variations of the interference fringes with the change of Δθ: (a) A schematic of Δθ; (b) Without the other misalignment errors; (b) With misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δφ = 0°).

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In the same manner, the influence of the deviation of azimuthal angle Δφ, a schematic of which is shown in Fig. 10(a), was also evaluated. Figure 10(b) shows the intensity distributions of the interference fringes under the condition without any misalignment errors except Δφ. As can be seen in the figure, it was verified that Δφ will cause the visible stripes with the absence of the angular misalignment errors of the mirrors. The influence of Δφ became obvious when angular misalignment errors of the mirrors were introduced; Fig. 10(c) shows the calculated intensity distributions under the condition with the same angular misalignment errors of the mirrors as the simulation shown in Fig. 8. These results well agree with the theoretical analysis described in the previous section.

 figure: Fig. 10

Fig. 10 Simulated variations of the interference fringes with the change of Δφ: (a) A schematic of Δφ; (b) Without the other misalignment errors; (b) With misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δθ = 0°).

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Following the computer simulation described above, experiments were carried out. Figure 11 shows the optical setup constructed for the orthogonal two-axis Lloyd’s mirror interferometer. A HeCd laser (λ = 441.6 nm) was employed as the light source for the interferometer. A TEM00 linearly polarized laser light was made to pass through a spatial filter composed of an objective lens (N.A. = 0.65) and a pinhole with a diameter of 5 μm, and was then collimated by a collimating lens with an effective focal length of 200 mm. The collimated laser light was made incident to the interferometer unit composed of a pair of flat mirrors and a substrate. The interferometer unit was mounted on a rotary stage having its rotational axis parallel with the A-axis in the figure so that the angle between the direction of incident light and the substrate surface θ could be adjusted. Meanwhile, the interferometer unit was held stationary about the C-axis in the figure with the azimuthal angle φ of 45°. In the interferometer unit, a mirror tilting system was implemented so that the Y-mirror could be rotated about the X- and Z-axes, simultaneously. By inserting thin metal plates between the Y-mirror and the base plate of the interferometer unit, the angular misalignment errors of the Y-mirror ΔϕYX and ΔϕYZ can be adjusted. A glass substrate with the size of 30 mm × 24 mm coated with layers of an adhesion promoting agent and a positive photoresist with thicknesses of 100 nm and 350 nm, respectively, was also mounted on the interferometer unit. In the following experiments, the glass substrate was exposed with the 2D interference fringes generated by the orthogonal two-axis Lloyd's mirror interferometer, and was then developed by a NaOH solution with a volume concentration of 0.5%.

 figure: Fig. 11

Fig. 11 A schematic of the constructed experimental setup.

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Experiments were carried out under the condition of φ = 45° and θ = 71.8°. Figure 12(a) shows the fabricated grating structures on each glass plate, which were observed by an optical microscope with a magnification rate of × 500 to see the periods of visible stripes induced by the misalignment errors in the optical setup. It should be noted that the mirrors in the interferometer unit should have initial angular misalignment errors ΔϕXY0, ΔϕXZ0, ΔϕYX0 and ΔϕYZ0. To verify the influence of the angular misalignment errors of the Y-mirror, ΔϕYX was increased from ΔϕYX0 to ΔϕYX0 + 0.182° by using the mirror tilting system. As can be seen in the figure, visible stripes slightly inclined with respect to the Y-axis were found in each case. Figure 12(b) summarizes the variation of the period of the visible stripes. The period decreased with the increase of ΔϕYX; these results imply that the initial angular misalignment error ΔϕYX0 was positive. In the same manner, the influence of the ΔϕYZ was also evaluated in experiments. ΔϕYX was set to be ΔϕYX0, while ΔϕYZ was changed from ΔϕYZ0 to ΔϕYZ0-0.5°. Figure 12(c) shows the results, and 12(d) summarizes the variation of the period of the visible stripes. As can be seen in the figure, the period had a local maximum value. From these results, ΔϕYZ0 was considered to be between 0.4° and 0.5°. The tendency of the variations of period well agreed with the simulation results, which verified the feasibility of the simulation described above.

 figure: Fig. 12

Fig. 12 Variation of the period of visible stripes as the changes of ΔϕYX and ϕYZ: (a) Variation of the period of visible stripes with the increase of ΔϕYX observed by the microscope; (b) A summary of (a); (c) Variation of the period of visible stripes with the increase of ΔϕYZ observed by the microscope; (d) A summary of (c).

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4.2 Elimination of the visible stripes due to the misalignment errors

As can be seen in the results of computer simulation and experiments, it is clear that the visible stripes are generated by the beat and moiré occurred by the superimposition of several types of interference fringes. According to the experimental results in the previous subsection, the visible stripes still remain even after careful alignments of optical components in the setup. A more fundamental method for eliminating the visible stripes is therefore required. Careful investigation on the superimposed fringe patterns can find out that the interference fringes to be generated by the beams 1, 2 and 3 are enough for the fabrication of two-axis grating structures. Therefore, in this paper, a major modification has been made to the optical configuration for the two-axis orthogonal Lloyd's mirror interferometer. Figure 13 shows a schematic and a photograph of the modified interferometer unit in the optical setup. In the modified interferometer, only three beams (beams 1, 2 and 3) will be used to generate interference fringe patterns. To prevent the influences of beams 4 and 4', physical filters were placed on the surfaces of both the X- and Y-mirrors.

 figure: Fig. 13

Fig. 13 A schematic and a photograph of the modified interferometer unit.

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Computer simulation was carried out to see the effect of the modification. At first, the intensity distribution of the interference fringes to be generated by the three-beam interference was calculated under the condition without the angular misalignment errors of the optical components. Figure 14(a) shows the intensity distribution of the interference fringes to be acquired by the three-beam interference. It was verified that the three-beam interference could also generate 2D fringe patterns. Meanwhile, on the other hand, the grating structure acquired from the fringe patterns will have an elliptical shape as can be seen in the figure; this is due to the influence of the interference fringes to be generated by the pair of beams 2 and 3. A polarization modulation technique [13] was therefore applied to the developed optical setup; in the technique, the polarization direction of each beam is controlled so that the beams 2 and 3 can interfere with the beam 1, while preventing the interference between the beams 2 and 3. Figure 14(b) shows the intensity distribution of the interference fringe of the three-beam interference with the polarization modulation technique. The elliptical shape of the grating structure is expected to be successfully eliminated with the technique.

 figure: Fig. 14

Fig. 14 Intensity distribution of the interference fringes to be acquired by the three-beam interference: (a) Three-beam interference without the polarization modulation; (b) Three-beam interference with the polarization modulation.

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In the same manner as the previous subsection, computer simulation was also carried out under the condition with the angular misalignment errors of the mirrors. Figure 15(a) shows the calculated intensity distributions with the same angular misalignment errors of the mirrors as the simulation shown in Fig. 8. Differing from the result shown in Fig. 8, there are not any visible stripes on the calculated intensity distribution of the interference fringes shown in Fig. 15(a). Figure 15(b) shows the closed-up image of the interference fringes shown in Fig. 15(a). The interference fringes were found to be affected by the misalignment errors of the optical setup. However, the polarization modulation technique is effective in eliminating the influences of the misalignment error; Fig. 15(c) shows the result with the polarization modulation technique. From these results, it was verified that the proposed three-beam interference could generate distortion-free 2D fringe patterns with the employment of the polarization modulation technique.

 figure: Fig. 15

Fig. 15 Intensity distribution of the interference fringes to be acquired by the three-beam interference under the condition with the misalignment errors of ϕXY = 0.08°, ϕYX = 0.08°, ϕXZ = 0.4°, ϕYZ = 0.4° and Δφ = 0.4°: (a) Three-beam interference without the polarization modulation control; (b) Closed up image of (a); (c) Closed up image of the three-beam interference with the polarization modulation control.

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Following the simulation results, experiments were carried out by using the interferometer unit shown in Fig. 13. All the experimental conditions were the same as those in the previous subsection, except the polarization modulation control unit composed of several half-wavelength plates (HWPs) and the physical filters for eliminating the beams 4 and 4'. Figure 16(a) shows a photograph of the fabricated 2D grating structures. As can be seen in the figure, the visible stripes observed on the grating structures fabricated by the previous optical setup were successfully eliminated, and grating structures free from visible stripes were fabricated in a large area of 12 mm × 12 mm. Figures 16(b) and 16(c) show the AFM image of the fabricated 2D grating structures and its cross-section images along the X- and Y-directions. From these results, feasibility of the modified two-axis Lloyd's mirror interferometer has successfully been verified.

 figure: Fig. 16

Fig. 16 Fabricated two-axis grating structures with the modified optical setup: (a) A photograph; (b) An AFM image; (c) Cross sectional images of the fabricated grating structures.

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5. Conclusions

For defect-free fabrication of the two-dimensional grating structures by the orthogonal two-axis Lloyd's mirror interferometer, a detailed analysis has been carried out focusing on the influences of misalignment errors in the optical setup for the interferometer. Influences of the misalignment errors in the optical setup have been theoretically investigated to clarify the mechanism of the generation of visible stripes, which always exist on the fabricated grating structures. Computer simulation and experiments have also been carried out to verify the theoretical analysis, and it has been revealed that the visible stripes occur as a result of the superimposition of the groups of line interference fringes having different interference pattern periods and directions. Regarding the theoretical analysis, a major modification has been introduced to the optical setup of the orthogonal two-axis Lloyd's mirror interferometer in such a way that the physical filters have been placed on the X- and Y-mirrors to prevent interference fringes generated by the beam 4 and 4'. A polarization modulation technique has also been employed to eliminate the elliptical shape of the grating structures to be fabricated from the interference fringes. Two-dimensional grating structures with the area of 12 mm × 12 mm have successfully been fabricated by the modified interferometer, verifying its feasibility for the fabrication of defect-free two-dimensional grating structures at a single exposure.

Funding

Japan Society for the Promotion of Science (JSPS).

References and links

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Figures (16)

Fig. 1
Fig. 1 Optical configurations for the Lloyd's mirror interferometer: (a) Traditional one-axis Lloyd's mirror interferometer; (b) Orthogonal two-axis Lloyd's mirror interferometer; (c) Definition of θ and φ in this paper.
Fig. 2
Fig. 2 Visible stripes observed on the fabricated grating structures: (a) A photograph of the fabricated grating structures; (b) Optical microscope image at the point A in (a) (bright area); (c) Optical microscope image at the point B in (a) (dark area).
Fig. 3
Fig. 3 Angular misalignment errors of the X- and Y-mirrors.
Fig. 4
Fig. 4 A geometric relationship between the symmetry plane of incidence and the substrate surface.
Fig. 5
Fig. 5 Influences of the angular misalignment errors ΔϕXZ, and ΔϕYZ on the Y-directional line interference fringes: (a) Superimposed fringe patterns under the misalignment-free condition; (b) Superimposed fringe patterns with the angular misalignment errors of the mirrors ΔϕXZ and ΔϕYZ.
Fig. 6
Fig. 6 Influence of the angular misalignment error of the Y-mirror about the X-axis (ΔϕYX): (a) A schematic of ΔϕYX; (b) ΔϕYX = −0.08°; (c) ΔϕYX = −0.04°; (d) ΔϕYX = 0°; (e) ΔϕYX = 0.04°; (f) ΔϕYX = 0.08°.
Fig. 7
Fig. 7 Influence of the angular misalignment error of the Y-mirror about the Z-axis (ΔϕYZ): (a) A schematic of ΔϕYZ; (b) ΔϕYZ = −0.4°; (c) ΔϕYZ = −0.04°; (d) ΔϕYZ = 0°; (e) ΔϕYZ = 0.04°; (f) ΔϕYZ = 0.4°.
Fig. 8
Fig. 8 Interference fringes affected by the angular misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δφ = 0°).
Fig. 9
Fig. 9 Simulated variations of the interference fringes with the change of Δθ: (a) A schematic of Δθ; (b) Without the other misalignment errors; (b) With misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δφ = 0°).
Fig. 10
Fig. 10 Simulated variations of the interference fringes with the change of Δφ: (a) A schematic of Δφ; (b) Without the other misalignment errors; (b) With misalignment errors (ΔϕXY = 0.08°, ΔϕYX = 0.08°, ΔϕXZ = 0.4°, ΔϕYZ = 0.4°, Δθ = 0°).
Fig. 11
Fig. 11 A schematic of the constructed experimental setup.
Fig. 12
Fig. 12 Variation of the period of visible stripes as the changes of ΔϕYX and ϕYZ: (a) Variation of the period of visible stripes with the increase of ΔϕYX observed by the microscope; (b) A summary of (a); (c) Variation of the period of visible stripes with the increase of ΔϕYZ observed by the microscope; (d) A summary of (c).
Fig. 13
Fig. 13 A schematic and a photograph of the modified interferometer unit.
Fig. 14
Fig. 14 Intensity distribution of the interference fringes to be acquired by the three-beam interference: (a) Three-beam interference without the polarization modulation; (b) Three-beam interference with the polarization modulation.
Fig. 15
Fig. 15 Intensity distribution of the interference fringes to be acquired by the three-beam interference under the condition with the misalignment errors of ϕXY = 0.08°, ϕYX = 0.08°, ϕXZ = 0.4°, ϕYZ = 0.4° and Δφ = 0.4°: (a) Three-beam interference without the polarization modulation control; (b) Closed up image of (a); (c) Closed up image of the three-beam interference with the polarization modulation control.
Fig. 16
Fig. 16 Fabricated two-axis grating structures with the modified optical setup: (a) A photograph; (b) An AFM image; (c) Cross sectional images of the fabricated grating structures.

Tables (4)

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Table 1 Interference fringe patterns and periods gnm to be generated by each pair of beams.

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Table 2 Influences of the angular misalignment errors of the mirrors on the interference fringes and their periods.

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Table 3 Influences of the deviation of the direction of the laser light made incident to the interferometer

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Table 4 Parameters for the computer simulation.

Equations (7)

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E i = E i e i exp ( j k i r + γ i ) ( i =1, 2, 3, 4)
k 1 = 2 π λ ( cos θ 1 cos ϕ cos θ 1 sin ϕ sin θ 1 ) , k 2 = 2 π λ ( cos θ 2 cos ϕ cos θ 2 sin ϕ sin θ 2 ) , k 3 = 2 π λ ( cos θ 3 cos ϕ cos θ 3 sin ϕ sin θ 3 ) , k 4 = 2 π λ ( cos θ 4 cos ϕ cos θ 4 sin ϕ sin θ 4 )
I ( r ) = = 1 4 E 2 + 2 m = 2 4 n < m E m E n e m e n cos { ( k n k m ) r + φ n φ m }
g n m = 2 π | k m k n | ( n < m 4 )
g x = g y = λ 2 cos θ 1
k 1 = 2 π λ ( cos θ cos ϕ cos θ sin ϕ sin θ ) , k 2 = 2 π λ ( cos ( θ + 2 Δ φ X Y ) cos ( ϕ 2 Δ φ X Z ) cos ( θ + 2 Δ φ X Y ) sin ( ϕ 2 Δ φ X Z ) sin ( θ + 2 Δ φ X Y ) ) , k 3 = 2 π λ ( cos ( θ + 2 Δ φ Y X ) cos ( ϕ + 2 Δ φ Y Z ) cos ( θ + 2 Δ φ Y X ) sin ( ϕ + 2 Δ φ Y Z ) sin ( θ + 2 Δ φ Y X ) ) , k 4 = 2 π λ ( cos ( θ + 2 Δ φ X Y + 2 Δ φ Y X ) cos ( ϕ 2 Δ φ X Z 2 Δ φ Y Z ) cos ( θ + 2 Δ φ X Y + 2 Δ ϕ Y X ) sin ( ϕ 2 Δ φ X Z 2 Δ φ Y Z ) sin ( θ + 2 Δ φ X Y + 2 Δ φ Y X ) ) , k 4 ' = 2 π λ ( cos ( θ + 2 Δ φ X Y + 2 Δ φ Y X ) cos ( ϕ + 2 Δ φ X Z + 2 Δ φ Y Z ) cos ( θ + 2 Δ φ X Y + 2 Δ φ Y X ) sin ( ϕ + 2 Δ φ X Z + 2 Δ φ Y Z ) sin ( θ + 2 Δ φ X Y + 2 Δ φ Y X ) )
k 1 = 2 π λ ( cos ( θ + Δ θ ) cos ( ϕ + Δ ϕ ) cos ( θ + Δ θ ) sin ( ϕ + Δ ϕ ) sin ( θ + Δ θ ) ) , k 2 = 2 π λ ( cos ( θ + Δ θ + 2 Δ φ X Y ) cos ( ϕ + Δ ϕ 2 Δ φ X Z ) cos ( θ + Δ θ + 2 Δ φ X Y ) sin ( ϕ + Δ ϕ 2 Δ φ X Z ) sin ( θ + Δ θ + 2 Δ φ X Y ) ) , k 3 = 2 π λ ( cos ( θ + Δ θ + 2 φ Y X ) cos ( ϕ + Δ ϕ + 2 Δ φ Y Z ) cos ( θ + Δ θ + 2 Δ φ Y X ) sin ( ϕ + Δ ϕ + 2 Δ φ Y Z ) sin ( θ + Δ θ + 2 Δ φ Y X ) ) , k 4 = 2 π λ ( cos ( θ + Δ θ + 2 Δ φ X Y + 2 Δ φ Y X ) cos ( ϕ + Δ ϕ 2 Δ φ X Z 2 Δ φ Y Z ) cos ( θ + Δ θ + 2 Δ φ X Y + 2 Δ φ Y X ) sin ( ϕ + Δ ϕ 2 Δ φ X Z 2 Δ φ Y Z ) sin ( θ + Δ θ + 2 Δ φ X Y + 2 Δ φ Y X ) ) , k 4 ' = 2 π λ ( cos ( θ + Δ θ + 2 Δ φ X Y + 2 φ Y X ) cos ( ϕ + Δ ϕ + 2 Δ φ X Z + 2 Δ φ Y Z ) cos ( θ + Δ θ + 2 Δ φ X Y + 2 φ Y X ) sin ( ϕ + Δ ϕ + 2 Δ φ X Z + 2 Δ φ Y Z ) sin ( θ + Δ θ + 2 Δ φ X Y + 2 Δ φ Y X ) )
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