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We correct two small errors in our publication [Opt. Express 21, 22441 (2013)].
© 2014 Optical Society of America
First, Eq. (3) in our publication [1] has a typographical error, with a squared factor missing in the denominator. The correct version reads as follows:
Second, in [1] we assigned the mode families investigated as TM1 and TM2. Subsequent measurements show that these modes are actually transverse electric, TE1 and TE2. A new version of Fig. 2 showing simulated mode profiles and dispersion for the TE modes is given below. The measured dispersion values and the conclusion that the investigated devices have normal group velocity dispersion remain unchanged.
Fig. 2 Measured and simulated dispersion of silicon nitride waveguides for 550 nm and 765 nm film thicknesses. The inset shows the TE1 and TE2 mode profiles for 550 nm waveguide thickness. The solid lines show the simulated data while the dots show the measured data. The values in the parentheses in the legend indicate the height of the waveguide.
References and links
1. P. H. Wang, Y. Xuan, L. Fan, L. T. Varghese, J. Wang, Y. Liu, X. Xue, D. E. Leaird, M. Qi, and A. M. Weiner, “Drop-port study of microresonator frequency combs: power transfer, spectra and time-domain characterization,” Opt. Express 21(19), 22441–22452 (2013). [CrossRef] [PubMed]
