Abstract
In recent years high-resolution microscopy has experienced the application of probe-based scanning techniques such as the scanning near field optical microscope1 (SNOM). In contrast to conventional optical far-field imaging, the SNOM utilizes a non-propagating (evanescent) nearfield, whereby the achievable lateral resolution overcomes the far-field diffraction limit of λ/2 where λ is the wavelength of the imaging light.
© 1997 Optical Society of America
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