Abstract
Characteristics and performance of a novel optical recording material in which information is recorded by surface deformation are described. This deformation recording material (DRM) has a high sensitivity (0.5 NJ/U2) independent of wavelength and adapted for use with a low-power He-Ne or diode laser. As opposed to ablative-type material, DRM type gives sharp clean reproducible recorded points free of relief rims and debris, which make possible carrier to noise ratio as high as 65 dB within 30 kHz for frequencies in the 10-15-MHz range.
© 1981 Optical Society of America
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