Abstract
We describe a scanning near-field optical microscope (SNOW) based on fiber-optical techniques1 combined with a spectrometer. In many approaches, only the illumination or the detection of the light is made in the near- field.2-1 However, in our microscope, the fiber tip attached to a bidirectional fiber coupler is used simultaneously as a subwavelength-size light source and read-out aperture. In the reflection mode, we do not find speckle patterns superimposed on the image as usually appear in the optical tunneling mode.4 Reflection SNOM images are, therefore, easier to interpret and can give a measure of the sample topography.
© 1993 Optical Society of America
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