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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2000),
  • paper CWK44

Determination of the refractive index of photonic-crystal material from scattering measurements

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Abstract

The rapid progress of nanotechnology now allows the development of devices based on the properties of photonic crystals, for instance, optical filters, switches and wave guides. Twodimensional photonic crystals built as arrays of parallel dielectric circular rods by additive nanolithography using a Si-based precursor have been fabricated and investigated. Their dimensions (diameter and spacing of the rods) are defined in the production process, but the determination of the refractive indices of the rod material presents a formidable task. Bulk material measurements would require a costly production of suitable layers and their results probably would not agree with the in situ values for thin rods.

© 2000 Optical Society of America

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