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Conferences > CLEOPR > 2009 > WD4 > WD4_2
  • Conference on Lasers and Electro-Optics/Pacific Rim 2009
  • (Optica Publishing Group, 2009),
  • paper WD4_2

Observation of 100 nm × 100 nm square holes on Pt thin film with scanning near-field optical microscope

Yasushi Oshikane, Toshihiko Kataoka, Masahiko Nagai, Toshiya Goto, Haruyuki Inoue, and Motohiro Nakano

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Abstract

A FIBed array of 100 nm square holes on Pt thin film is scanned by a scanning near-field optical microscope (SNOM) system with a 500 nm spherical probe. The holes and surface plasmon interferences are observed clearly.

© 2009 IEEE

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