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Conferences > CLEOPR > 2022 > CFA17G > CFA17G_04

Out-of-the-laboratory transfer of an optical sensor: inspection of dielectric thin films on industrial rough aluminum

Yannic Toschke, Bjoern Bourdon, and Mirco Imlau

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Abstract

We demonstrate a novel interference based optical sensor for the inspection of trivalent chromium conversion coatings on cold-rolled aluminum. The focus is placed on an out-of-the-laboratory, open-source prototype employing the emerging field of 3D-printing.

© 2022 IEEE

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