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Conferences > CLEOPR > 2022 > CMP11A > CMP11A_06

Near-field Analysis of VCSELs after HTOL test

Hao-Tien Cheng, Taixian Zhang, Yun-Cheng Yang, Te-Hua Liu, and Chao-Hsin Wu

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Abstract

Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.

© 2022 IEEE

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