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Conferences > CLEO_AT > 2017 > JW2A > JW2A.10

Highly Sensitive Back-Focal-Plane Interferometry for Tracking Nanoparticle Position

Shuzo Masui, Masaki Michihata, Kiyoshi Takamasu, and Satoru Takahashi

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Abstract

Recently, nanoparticles have played important roles in various fields. Back-focal-plane interferometry is a widely used method for nanoparticle tracking. We proposed and demonstrated a method to improve the sensitivity of back-focal-plane interferometry.

© 2017 Optical Society of America

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