Optical probe of pka in organic materials using the Z-scan technique

R.E. de Araujo; A S. L. Gomes; Cid B de Araújo

Conference on Lasers and Electro-Optics Europe
Technical Digest Series (Optica Publishing Group, 2000),
paper CWF6

Optical probe of pk_a in organic materials using the Z-scan technique

R.E. de Araujo, A S. L. Gomes, and Cid B de Araújo

The European Conference on Lasers and Electro-Optics 2000

Nice France
10–15 September 2000
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Poster Session (CWF)

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R. E. de Araujo, A. S. L. Gomes, and C. B. de Araújo, "Optical probe of pka in organic materials using the Z-scan technique," in Conference on Lasers and Electro-Optics Europe, Technical Digest Series (Optica Publishing Group, 2000), paper CWF6.

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Abstract

The characterization of material's properties requires the development of techniques that should be simple, easy to implement, as well as easy to interpret. In particular, the field of Nonlinear Optics[1] offers powerful techniques to characterize materials, which may find applications in different areas.

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