Detecting Spurious Reflections in Integrated Photonic Devices

Robert Halir; Íñigo Molina-Fernández; Alejandro Ortega-Moñux; Pavel Cheben; Siegfried Janz; Dan-Xia Xu

CLEO/Europe and EQEC 2009 Conference Digest
(Optica Publishing Group, 2009),
paper CK_P4

Detecting Spurious Reflections in Integrated Photonic Devices

Robert Halir, Íñigo Molina-Fernández, Alejandro Ortega-Moñux, Pavel Cheben, Siegfried Janz, and Dan-Xia Xu

The European Conference on Lasers and Electro-Optics 2009

Munich Germany
14–19 June 2009
ISBN: 978-1-4244-4080-1

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R. Halir, Í. Molina-Fernández, A. Ortega-Moñux, P. Cheben, S. Janz, and D. Xu, "Detecting Spurious Reflections in Integrated Photonic Devices," in CLEO/Europe and EQEC 2009 Conference Digest, (Optica Publishing Group, 2009), paper CK_P4.

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Abstract

Spurious reflections can be a problematic issue in integrated optical devices, such as lasers [1], detectors [2], or multi-mode interference (MMI) couplers [3]. Here we demonstrate a simple method to localize such faint reflections occurring inside the chip, using only wavelength-swept power transmission measurements. The method does not require a special measurement setup and is based on minimum phase techniques, which were recently proposed for integrated optical device characterization [4].

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