Abstract
Precise characterization techniques for ultrashort optical pulses have become indispensible with the emergence of ever shorter waveforms. Typically the pulse under study is overlapped with an optical gate and analyzed after a nonlinear interaction with the latter. If the duration of the pulse to be characterized is much shorter or longer than available gate sources, streak cameras [1, 2] or electro-optic sampling [3] are used, respectively. If the duration of both pulses is similar, auto- and cross-correlation techniques [4] are required, which need complex deconvolution algorithms and are often limited to bandwidths below one optical octave.
© 2011 Optical Society of America
PDF ArticleMore Like This
O. Schubert, F. Junginger, C. Riek, A. Sell, A. Leitenstorfer, and R. Huber
CTuH5 CLEO: Science and Innovations (CLEO:S&I) 2011
Bernd Schütte, Ulrike Frühling, Roland Kalms, Marek Wieland, Armin Azima, and Markus Drescher
QTuC3 Quantum Electronics and Laser Science Conference (CLEO:FS) 2011
A. Gliserin, F. O. Kirchner, M. Walbran, F. Krausz, and P. Baum
09.Wed.P3.45 International Conference on Ultrafast Phenomena (UP) 2014