Abstract
We experimentally, numerically and semi-analytically study the effect of the substrate on the Kerker-type scattering in ultra-thin nanodisk metasurface. A transfer matrix approach can be successfully used to account for the substrate effect in the semi-analytical case and explains the experimentally measured reflection dip of a Silicon nanodisk metasurface on SiO2/Si substrate.
© 2021 The Author(s)
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