Abstract
Based on single-shot spectral interferometry, transient measuring technology of laser wakefield at the SILEX-I: Ti: Sapphire Laser is developed. The wakefield is captured with ~140 fs resolution over a temporal region of 1 ps.
© 2012 Optical Society of America
PDF ArticleMore Like This
N. H. Matlis, S. Reed, S. S. Bulanov, V. Chvykov, G. Kalintchenko, T. Matsuoka, P. Rousseau, V. Yanovsky, A. Maksimchuk, S. Kalmykov, G. Shvets, and M. C. Downer
MD1 International Conference on Ultrafast Phenomena (UP) 2006
N. H. Matlis, S. Reed, S. S. Bulanov, V. Chvykov, G. Kalintchenko, T. Matsuoka, P. Rousseau, V. Yanovsky, A. Maksimchuk, and M. C. Downer
JWC3 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006
C. W. Siders, S. P. Le Blanc, D. Fisher, T. Tajima, M. C. Downer, A. Babine, A. Stepanov, and A. Sergeev
SaA.3 International Conference on Ultrafast Phenomena (UP) 1996