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Conferences > DH > 2010 > DMA > DMA1

The POGE (Principle Of Good Enough) in Optics

H. John Caulfield

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Abstract

POGE (Principle Of Good Enough) is shown to yield dramatic new capabilities in optical pattern recognition, optical linear algebra, point source location, and Fourier pattern recognition. POGE has become a powerful template for invention.

© 2010 Optical Society of America

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