Abstract
We demonstrate a super-resolved imaging based on a complex-amplitude pattern matching method. The accuracy in a size measurement of a nanostructured object is estimated by a computer simulation.
© 2014 Optical Society of America
PDF ArticleMore Like This
Shinji Ishikawa and Yoshio Hayasaki
TuO3_4 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2013
P. Burgholzer, M. Haltmeier, T. Berer, E. Leiss-Holzinger, and T. W. Murray
1041506 European Conference on Biomedical Optics (ECBO) 2017
Shinji Ishikawa and Yoshio Hayasaki
17p_D5_2 JSAP-OSA Joint Symposia (JSAP) 2013