Abstract
We have shown that the use of a nonlinear material as a Fourier filter in the common focus of two lenses in a 4 f setup allows all optical image processing (Fig. 1).1,2 The measurement of the nonlinear changes undergone by the image of an object in this setup can be used to characterize the nonlinear response of the Fourier filter.3 The method has been developed to measure the real and imaginary parts of X3 under picosecond excitation in various materials (liquids and crystals). It can be summarized as follows: f or an object 0(x,y), nonlinear image I (x,y) is recorded on a calibrated CCD camera, and compared with the calculated image Ic (x,y). The calculation of Ic (x,y) is made (analytically or numerically according to the choice of the object) using the following scheme:
© 1994 IEEE
PDF ArticleMore Like This
T. Mizumoto, N. Kimura, S. Tonami, and Y. Naito
CWF50 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 1994
G. Boudebs, M. Chis, A. Monteil, and M. Ferrari
QWD2 Quantum Electronics and Laser Science Conference (CLEO:FS) 1999
J. R. Lindie, J.S. Shirk, F. J. Bartoli, R. G. S. Pong, and M. E. Boyle
QWC18 International Quantum Electronics Conference (IQEC) 1994