Abstract
We present quantitative measurements of mechanical forces induced by evanescent light on a semiconductor probe tip via the surface photovoltage effect (SPV).1 The semiconducting tip is used as a sensitive sub-wavelength sized light detector. Scanning techniques allow the profiling of laterally inhomogeneous light distributions such as a standing wave pattern. A combination with the "local charge force microscopy" provides simultaneous information on local charge distributions on the surface.2
© 1994 IEEE
PDF ArticleMore Like This
M. Hipp, J. Mertz, J. Mlynek, and O. Marti
QThI3 International Quantum Electronics Conference (IQEC) 1994
Toshihiro Mino, Yuika Saito, and Prabhat Verma
20a_C3_2 JSAP-OSA Joint Symposia (JSAP) 2014
S. G. Grubb, E. Betzig, R. J. Chichester, D. J. DiGiovanni, and J. S. Weiner
WK12 Optical Fiber Communication Conference (OFC) 1994