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Conferences > EUVXRAY > 2020 > ETu1A > ETu1A.4

Hard X-ray in-situ full-field microscopy for material science applications

I. Snigireva, K. V. Falch, D. Casari, M. Di Michiel, C. Detlefs, R. Mathiesen, and A. Snigirev

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Abstract

Hard X-ray transmission microscopy based on refractive optics is applied as a tool in material science to study microstructure in two or three dimensions with spatial resolution of 100nm. A few possible application areas for the microscope are illustrated.

© 2020 The Author(s)

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