Abstract
Assembly-related misalignment aberrations in high-NA microscope objectives (MOs) are analyzed. Based on this analysis, the potential and limits of their compensation with a free-form phase plate located at the aperture stop are discussed.
© 2021 The Author(s)
PDF Article | Presentation VideoMore Like This
Sara Moein and Thomas J. Suleski
JTh3A.3 Flat Optics: Components to Systems (FLATOPTICS) 2021
Monjurul Meem, Apratim Majumder, Sourangsu Banerji, Berardi Sensale Rodriguez, and Rajesh Menon
JTu3A.44 CLEO: Applications and Technology (CLEO:A&T) 2021
David Kessler
120780A International Optical Design Conference (IODC) 2021