Abstract
The interference between all multiply scattered wave reaching a point in a random medium leads to large field fluctuation in the transmitted speckle pattern. We measure the statistics of dφ/dx, as well as of Idφ/dx, where φ is the phase accumulated by a microwave field as it traverses the sample, x is the transverse position at the output surface, and I is the transmitted intensity. Idφ/dx is the transverse photon flux.
© 2003 Optical Society of America
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