Abstract
Near-field scanning optical microscopy (NSOM) is used to directly measure transient interference between a guided and step induced leaky mode in a single mode waveguide. Simulations are in good agreement with the observed results.
© 2005 Optical Society of America
PDF ArticleMore Like This
G. Yuan, M.D. Stephens, D.S. Dandy, J.K. Gerding, A. Van Orden, and K.L. Lear
CThL7 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006
Guangwei Yuan, Matthew D. Stephens, David S. Dandy, and Kevin L. Lear
CThBB6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006
G. Yuan, P. Nikkel, C. Thangaraj, T. W. Chen, R. Pownall, A. Iguchi, and K. L. Lear
CThD4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006