Abstract
Nonlinear optical ellipsometry (NOE) was developed to interpret polarization information of the second harmonic generated (SHG) light at thin surface films. The experimentally simple instrument design allows for a mathematically straightforward evaluation of the data and yields greater information content than comparable intensity based techniques. The polarization- dependence of the SHG light yields the fully complex valued set of χ(2) nonlinear susceptibility tensor elements. The χ(2) tensor elements can then be related back to the structure of molecules at the silica/aqueous solution interface.
© 2005 Optical Society of America
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