Interferometry in a random medium with two coincident input beams

Z. Wang; A. M. Weiner; K. J. Webb

doi:10.1364/FIO.2006.FThJ3

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2006),
paper FThJ3
•https://doi.org/10.1364/FIO.2006.FThJ3

Interferometry in a random medium with two coincident input beams

Z. Wang, A. M. Weiner, and K. J. Webb

Frontiers in Optics 2006

Rochester, New York United States
10–13 October 2006
ISBN: 1-55752-818-7

From the session
Spatially Variant Polarization Fields, Polarized Speckle Patterns, Polarized Vortices and Polarization Aberrations II (FThJ)

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Z. Wang, A. M. Weiner, and K. J. Webb, "Interferometry in a random medium with two coincident input beams," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper FThJ3.

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Abstract

A two-beam random interferometer is demonstrated to have a second order speckle intensity frequency correlation with a ripple due to the path-length difference between the input beams and an envelope governed by the scattering medium.

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