Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > FiO > 2009 > FThT > FThT2
  • Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper FThT2
  • •https://doi.org/10.1364/FIO.2009.FThT2

At-wavelength and optical metrology of bendable x-ray optics for nanofocusing at the ALS

Sheng Yuan, Kenneth Goldberg, Valeriy V. Yashchuk, Richard Celestre, Tony Warwick, Wayne R. McKinney, Gregory Morrison, Senajith B. Rekawa, Iacopo Mochi, and Howard A. Padmore

Not Accessible

Your library or personal account may give you access

Abstract

We report on a new research and development program at the Advanced Light Source, Lawrence Berkeley National Lab directed to establish both at-wavelength and conventional optical metrology techniques suitable to characterize the surface profile of super-high-quality x-ray optics with sub-microradian precision.

© 2009 Optical Society of America

PDF Article
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use