A Laser–Speckle Correlation Technique for Thickness Determination of Optically Thin Transparent Layers

Johannes Lettner; Bernhard G. Zagar

doi:10.1364/FIO.2011.FThV2

Frontiers in Optics 2011/Laser Science XXVII
OSA Technical Digest (Optica Publishing Group, 2011),
paper FThV2
•https://doi.org/10.1364/FIO.2011.FThV2

A Laser–Speckle Correlation Technique for Thickness Determination of Optically Thin Transparent Layers

Johannes Lettner and Bernhard G. Zagar

Frontiers in Optics 2011

San Jose, California United States
16–20 October 2011
ISBN: 978-1-55752-917-6

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Nonimaging Techniques for Sensing III (FThV)

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J. Lettner and B. G. Zagar, "A Laser–Speckle Correlation Technique for Thickness Determination of Optically Thin Transparent Layers," in Frontiers in Optics 2011/Laser Science XXVII, OSA Technical Digest (Optica Publishing Group, 2011), paper FThV2.

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Abstract

We present a method determining thicknesses of thin polar liquids on rough surfaces. Results of the reproducibility of measurements of coatings down to the µm range, which is less than the surface roughness are shown.

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