Abstract
Wavefront sensor based on Quadriwave Lateral Shearing Interferometry is used to fully characterize flat optics and metasurfaces. It measures both the global optical function (phase shaping, MTF, PSF, …) but also the metastructure arrangement. © 2021 Valentin Genuer, Romain Laberdesque, Benoit Wattellier
© 2021 The Author(s)
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