Abstract
The thermal characteristics of a thin film VCSEL are studied both theoretically and experimentally. The theoretical analysis of thermal via effects is performed to determine optimized thickness range of VCSEL for the fully embedded structure.
© 2006 Optical Society of America
PDF ArticleMore Like This
J. A. Kash, F. E. Doany, L. Schares, C. L. Schow, C. Schuster, D. M. Kuchta, P. K. Pepeljugoski, J. M. Trewhella, C. W. Baks, R. A. John, L. Shan, Y. H. Kwark, R. A. Budd, P. Chiniwalla, F. R. Libsch, J. Rosner, C. K. Tsang, C. S. Patel, J. D. Schaub, D. Kucharski, D. Guckenberger, S. Hegde, H. Nyikal, R. Dangel, F. Horst, B. J. Offrein, C. K. Lin, A. Tandon, G. R. Trott, M. Nystrom, et al.
OFA3 Optical Fiber Communication Conference (OFC) 2006
R. Mehandru, G. Dang, B. Luo, S. Kim, F. Ren, S. J. Pearton, W. S. Hobson, J. Lopata, M. Tayahi, W. Chang, and H. Shen
CThA2 Conference on Lasers and Electro-Optics (CLEO:S&I) 2002
N. Suzuki, H. Hatakeyama, K. Fukatsu, T. Anan, K. Yashiki, and M. Tsuji
OFA4 Optical Fiber Communication Conference (OFC) 2006