Abstract
Currently, phase change materials are used in optical recording such as Blu-ray and DVD disk systems. Marks on the phase change recording layer of the optical disk are created at the parts that are heated by a recording optical beam and also are quickly cooled by a heat sink layer adjacent to the recording layer. Therefore, the edges of the recorded marks may be sifted that are inhibitory agent for high-density optical recording. It is required to achieve high-density optical disk systems that information marks are precisely recorded on the recording layer of the optical disk. The effects of the mark edge shifted linearly can be easily adjusted by using write and readout compensations. However, it is difficult to adjust the effects of the mark edge nonlinearly shifted.1)-2) Therefore, the method is desired that the amounts of nonlinear mark edge shift are measured quantitatively.
© 2011 Optical Society of America
PDF ArticleMore Like This
Takashi Ishida, Mamoru Shoji, Yoshiyuki Miyabata, Yasumasa Shibata, Eiji Ohno, and Shunji Ohara
TuC5 Optical Data Storage (ODS) 1994
Hidehiko Kando, Takeshi Maeda, Motoyasu Terao, Makoto Miyamoto, Akemi Hirotsune, and Hideo Ohnuki
MC.4 Optical Data Storage (ODS) 1998
X. S. Miao, L. P. Shi, P. K. Tan, X. Hu, H. B. Yao, J. M. Li, and T. C. Chong
TuE29 Optical Data Storage (ODS) 2003