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Single-beam technique based on nonlinear ellipse rotation measurements for ultrashort pulse characterization

R. M. Moysés, E. C. Barbano, and L. Misoguti

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Abstract

We found that the nonlinear refractive index measured by nonlinear-ellipse-rotation in thick sample can be used for ultrafast pulse width and chirp determination. The material’s dispersion value is used as a reference for this measurement.

© 2022 The Author(s)

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