Abstract
Thin and ultrathin films play an increasing role in science and technology. In most cases conventional methods cannot be used to measure the mechanical and elastic properties of these films. Therefore, new techniques for the analysis of layered structures with nanoscale depth resolution are urgently needed.
© 1995 Optical Society of America
PDF ArticleMore Like This
Martin Szabadi, Alexandre Kolomenski, and Peter Hess
CMD3 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 1994
Simone Anders, André Anders, C. Singh Bhatia, Sébastien Raoux, Dieter Schneider, Joel W. Ager, and Ian G. Brown
DLCC809 Applications of Diamond Films and Related Materials (DFM) 1995
B. Luther-Davies, M. Samoc, A. Samoc, M. Woodruff, J. Swiatkiewicz, R. Trebino, and K.W. Delong
ThD.4 Organic Thin Films for Photonic Applications (OTF) 1995