Abstract
Integrated optics require electro-optic materials with high non-linear coefficients. Oxidic materials have strong electro-optic coefficients and do not deteriorate under high process temperatures or due to aging as e.g. polymers do. Much attention has been paid to the growth of oxidic layers for ferroelectric applications as solid state memories. Layers have been grown by radio frequent sputtering [1], metalorganic vapour deposition [2] and pulsed laser deposition [3]. Some layers have been characterized electro-optically by measuring the birefringence [4] and the effective electro-optic coefficient rc has been determined from such measurements [5]. In this contribution we present the electro-optic coefficients r13 and r33 of a layer of BaTiO3 that we measured with ellipsometry.
© 1996 Optical Society of America
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