Abstract
Interferometers are essential tools for measuring optical wavelengths and frequencies. We demonstrate a new form of interferometry that is both simpler and more precise than conventional methods. Stable laser and electrooptic FM sideband techniques make a direct electronic measurement of the mode spacing of an ultrahigh finesse cavity with subhertz precision (0.4-Hz rms) over a 50-THz region. A new interferometer equation is derived in which all variables can be measured directly in situ. Experiments indicate errors below 10−10 over a 50-THz bandwidth and that the technique can be improved to the 10−12 level or beyond. No drift due to mirror aging has been observed over 420 days for a rate of <2 × 10−12/day. Our results indicate that low-loss multilayer dielectric mirrors are far more suitable for precision interferometry than previously thought, and we show how wavelength comparisons for 10−9 accuracy can be made with simple and inexpensive apparatus.
© 1987 Optical Society of America
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