Back-of-the-envelope diffraction analysis for optimizing the depth of focus of scanning beams

G.W. Forbes

doi:10.1364/ODP.1993.MB.2

Optical Design for Photonics
Technical Digest Series (Optica Publishing Group, 1993),
paper MB.2
•https://doi.org/10.1364/ODP.1993.MB.2

Back-of-the-envelope diffraction analysis for optimizing the depth of focus of scanning beams

G.W. Forbes

Optical Design for Photonics 1993

California United States
22–24 March 1993
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G. W. Forbes, "Back-of-the-envelope diffraction analysis for optimizing the depth of focus of scanning beams," in Optical Design for Photonics, Technical Digest Series (Optica Publishing Group, 1993), paper MB.2.

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Abstract

Simple models are most effective for feasibility studies and in the preliminary stages of design. A particularly simple, but accurate, model is presented for analyzing certain diffraction problems and it is applied to the optimization of scanning beam.

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