Abstract
InP/InGaAs avalanche photodiodes (APDs) hold considerable promise as receivers for long-haul high-bit-rate optical communication systems. There have been a few preliminary reports on their reliability,1,2 but the failure mode and mechanism are not yet clear. We describe the course of surface degradation of InP/InGaAs APDs and propose the failure mechanism involved.
© 1988 Optical Society of America
PDF ArticleMore Like This
J. C. CAMPBELL, W. T. TSANG, G. J. QUA, B. C. JOHNSON, and J. E. BOWERS
TuC3 Optical Fiber Communication Conference (OFC) 1988
Yan Liang, Zhihe Liu, Qilai Fei, and Heping Zeng
JTu2A.40 CLEO: Applications and Technology (CLEO:A&T) 2019
JOANNE LACOURSE and ROBERT OLSHANSKY
MG3 Conference on Lasers and Electro-Optics (CLEO:S&I) 1988