Abstract
Bragg grating devices require extremely small tolerance on the optical properties over a long time scale in order to assemble reliable WDM components. Other applications, such as sensors, are required to survive high temperatures. Therefore thermal stability of gratings and their lifetime forecast has received considerable attention in the last decade.1–7 New materials8–10 and post-fabrication treatments11–13 have been proposed to achieve enhanced thermal stability in optical fibers and waveguides. Tin-phosphosilicate fibers are low-loss in the third telecom window at 1.55 µm and exhibit high photosensitivity, but they have high numerical aperture (NA > 0.2).8 Oxynitride fibers are not photosensitive at 248 nm KrF laser radiation and require shorter wavelength lasers.9 Post-fabrication techniques usually require the fibers to be hydrogen loaded;11–13 this is time-consuming and induces high loss at 1.55 µm. UV sensitization can be optimized to reduce the induced loss but still requires the fiber to be hydrogen-loaded.14 Compared to other techniques, the use of SnO2 keeps the absorption at 1.55 µm low, is less time consuming and potentially cheaper. In particular, if tin is used only as a dopant, telecom compatible fibers can be fabricated.15 In this paper, the temperature stability of gratings written in tin-doped silicate (SS) fibers is evaluated by using the isothermal method.1
© 2002 Optical Society of America
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