Abstract
High-performance photodetectors operating at 1.55 µm wavelength are required for ultrafast photodetection in optical communication, mea surement, and sampling systems. The photodiode performance is measured by the bandwidth-effi-ciency product (BWE) and is limited for conventional vertically illuminated photodiodes (VPDs) due to the bandwidth-efficiency tradeoff.1 This tradeoff arises from the fact that the quantum efficiency and bandwidth of a conventional VPD, have inverse dependencies on the photoabsorption layer thickness. To overcome the BWE limitation for such conventional VPDs, two alternative detection schemes were offered: edge-coupled photodiodes and resonant-cavity-enhanced pho-todiodes (RCE-PDs). Both PD structures have demonstrated excellent performances and are potential candidates as photodetectors for future high bitrate optical communication systems.2–6 The ease of fabrication, integration, and optical coupling makes the RCE-PD more attractive for high-performance photodetection.
© 2002 Optical Society of America
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