Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Kristof Croes; Veerle Simons; Brecht Truijen; Philippe Roussel; Koen Van Sever; Artemisia Tsiara; Jacopo Franco; Philippe Absil

doi:10.1364/OFC.2022.W3D.3

Optical Fiber Communication Conference (OFC) 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper W3D.3
•https://doi.org/10.1364/OFC.2022.W3D.3

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, and Philippe Absil

Optical Fiber Communication Conference 2022

San Diego, California United States
6–10 March 2022
ISBN: 978-1-55752-466-9

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Photodetectors, Sensing and Microwave Photonics (W3D)

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K. Croes, V. Simons, B. Truijen, P. Roussel, K. Van Sever, A. Tsiara, J. Franco, and P. Absil, "Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors," in Optical Fiber Communication Conference (OFC) 2022, S. Matsuo, D. Plant, J. Shan Wey, C. Fludger, R. Ryf, and D. Simeonidou, eds., Technical Digest Series (Optica Publishing Group, 2022), paper W3D.3.

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Abstract

Dark current degradation mechanisms in Ge VPIN photodetectors were studied. A methodology to estimate the failure percentages has been developed and applied. Degradation/recovery processes and E_a-decrease of I_dark after stress suggest increased TAT during degradation.

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