Reflectace diagram-aided technique for optical coating design and monitoring

S.Y. Zheng; G. Ping; C.N. Yen; X. Ma

doi:10.1364/OIC.1988.TuD5

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper TuD5
•https://doi.org/10.1364/OIC.1988.TuD5

Reflectace diagram-aided technique for optical coating design and monitoring

S.Y. Zheng, G. Ping, C.N. Yen, and X. Ma

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
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S. Y. Zheng, G. Ping, C. N. Yen, and X. Ma, "Reflectace diagram-aided technique for optical coating design and monitoring," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper TuD5.

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Abstract

This paper describes mainly applications of amplitude reflectance diagram-aided technique in the design of both induced reflection and transmission filters with narrow bandwidth, as well as in the monitoring of all-dielectric multilayers with symmertric structure. Some experimental results are also reported.

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