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Studies on Optical Properties of Extremely Thin Films Using ATR Techniques

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Abstract

The optical properties of extremely thin films have been of considerable interest for years. Below a certain critical thickness, thin films consist of isolated islands. Their optical constants and properties depend on the shapes of the islands and their seperation, the substrate, the deposition conditions etc. The film optical properties therefore reflect the successive stages of film growth.

© 1988 Optical Society of America

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