Measurement of Birefringent Coatings by Envelope and Waveguide Methods*

Flavio Horowitz; Sergio Brito Mendes

doi:10.1364/OIC.1992.OThD9

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1992),
paper OThD9
•https://doi.org/10.1364/OIC.1992.OThD9

Measurement of Birefringent Coatings by Envelope and Waveguide Methods^*

Flavio Horowitz and Sergio Brito Mendes

Optical Interference Coatings 1992

Tucson, Arizona United States
1–5 June 1992
ISBN:

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Optical Characterization (OThD)

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F. Horowitz and S. B. Mendes, "Measurement of Birefringent Coatings by Envelope and Waveguide Methods*," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1992), paper OThD9.

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Abstract

Spectrophotometric and prism-coupler experimental data on thermally- deposited dielectric films are analyzed by Envelope and Waveguide Methods. A detailed comparison for Lead Fluoride and obliquely deposited Cerium Oxide coatings is shown.

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