Nonlinear Optical Coating Indices and Thickness Measured by Spectroscopic Ellipsometry

J. L. Stehle; J. L. Stehle; A. Toussaere; J. Ziss

doi:10.1364/OIC.1992.OThE1

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1992),
paper OThE1
•https://doi.org/10.1364/OIC.1992.OThE1

Nonlinear Optical Coating Indices and Thickness Measured by Spectroscopic Ellipsometry

J. L. Stehle, A. Toussaere, and J. Ziss

Optical Interference Coatings 1992

Tucson, Arizona United States
1–5 June 1992
ISBN:

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Ellipsometry (OThE)

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J. L. Stehle, A. Toussaere, and J. Ziss, "Nonlinear Optical Coating Indices and Thickness Measured by Spectroscopic Ellipsometry," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1992), paper OThE1.

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Abstract

Nonlinear optical coatings, oriented doped polymers, can be used in guided optics multiplexer devices. Ordinary and extraordinary indices are characterized by spectroscopic ellipsometry.

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