Abstract
Optical monitoring is setup into a vacuum chamber to carry out experimental measurements of the reflectivity of p- and s-polarized light entering at 45 degrees of incidence allowing the calculation of the term Δ=Rs2-Rp. It is well known from geometric optics that this term Δ equals zero for the bare substrate but it presents some variations when the surface is modified by a very thin-film growing up onto it.
© 1995 Optical Society of America
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