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Effects of Rough Interfaces in a Thin-Film

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Abstract

A thin film of materials that crystalize rapidly during its growth, as in the case of flourines and oxides, present shallow surface roughness. Reflectance studies of these materials show small scattering that in general is negligeable. Studies on Pyridine/Ag (1) y WO3/Au (2) have shown resonances in the reflectance spectrum associated with the excitation of Surface Plasmons.

© 1995 Optical Society of America

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