Abstract
A novel strategy of choosing ellipsometric data is presented for more accurate optical characterization of thin film materials based on partial derivatives analysis and selection.
© 2013 Optical Society of America
PDF ArticleMore Like This
A. A. Tikhonravov, A. V. Tikhonravov, and M. K. Trubetskov
WE4 Optical Interference Coatings (OIC) 2004
Alexander V. Tikhonravov, Michael K. Trubetskov, Oleg F. Prosovskiy, and Michael A. Kokarev
WDPDP2 Optical Interference Coatings (OIC) 2007
Tuan-Shu Ho, Chien-Chung Tsai, Kuang-Yu Hsu, and Sheng-Lung Huang
JW2A.49 CLEO: Applications and Technology (CLEO:A&T) 2013